Submitted to: Proceedings of SPIE
Publication Type: Proceedings
Publication Acceptance Date: 10/23/2005
Publication Date: 11/20/2005
Citation: Cheng, X., Chen, Y.R., Tao, Y., Chen, X. 2005. Gabor-wavelet decomposition and integrated PCA-FLD method for texture based defect classification. Proceedings of SPIE 2005 Conference. 5996:5996OV1-V9.
Technical Abstract: In many hyperspectral applications, it is desirable to extract the texture features for pattern classification. Texture refers to replications, symmetry of certain patterns. In a set of hyperspectral images, the differences of image textures often imply changes in the physical and chemical properties on or underneath the surface. In this paper, we utilize Gabor wavelet based texture analysis method for textural pattern extraction, and combined with integrated PCA-FLD method for hyperspectral band selection in the application of classifying chilling damaged cucumbers from normal ones. The classification performances are compared and analyzed.