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Title: Registration of common bacterial blight resistant cranberry dry bean germplasm line USCR-CBB-20

item Miklas, Phillip - Phil
item SINGH, S - University Of Idaho
item TERAN, H - University Of Idaho
item KELLY, J - Michigan State University
item Smith, James - Rusty

Submitted to: Journal of Plant Registrations
Publication Type: Peer Reviewed Journal
Publication Acceptance Date: 7/15/2010
Publication Date: 1/1/2011
Citation: Miklas, P.N., Singh, S.P., Teran, H., Kelly, J.D., Smith, J.R. 2011. Registration of Common Bacterial Blight Resistant Cranberry Dry Bean Germplasm Line USCR-CBB-20. Journal of Plant Registrations. 5:98-102.

Interpretive Summary: Common bacterial blight is a problematic disease for dry edible bean production (pinto, kidney. Black, navy, cranberry) in the U.S. east of the continental divide. The disease is seed-borne and can result in more than 50% yield loss under severe epidemics. Cranberry beans and other large-seeded bean types like kidney beans are prone to bacterial infections. Our goal was to develop a cranberry bean with improved resistance to common blight so that breeders in the Midwest and elsewhere across the country would have a new source of resistance to use for cranberry bean cultivar development. The germplasm line USCR-CBB-20 combines resistance to common bacterial blight with high yield potential and resistance to viruses. Traditional and marker-assisted selection techniques were used to develop this cranberry bean germplasm. Improved resistance to common bacterial blight in cranberry beans will reduce yield loss and improve economic returns to bean growers across the U.S.

Technical Abstract: Common bacterial blight is a serious disease of dry edible beans in warm humid climates. The disease is most prominent east of the continental divide in the U.S. Large seeded dry beans from the Andean gene pool, such as those in the cranberry bean market class are very susceptible to this disease. Our objective was to develop a cranberry bean line with improved resistance to common bacterial blight. A combination of marker-assisted selection for resistance QTL in early generations, followed by phenotypic selection for disease resistance in later generations, was used to develop the cranberry dry bean germplasm line USCR-CBB-20 with improved resistance to common bacterial blight. USCR-CBB-20 possesses the SU91 and SAP6 resistance-linked SCAR (sequence characterized amplified region) markers associated with QTL on linkage groups 8 and 10. This line had an average disease score of 5.3 in greenhouse tests, which is a remarkable improvement over the previous cranberry germplasm line released for common bacterial blight resistance which scored 8.4 (note 9 is completely susceptible) in the same tests. Except for small seed size, USCR-CBB-20 exhibits commercially acceptable agronomic traits for the cranberry bean market class. Yield potential was above average in Michigan and below average in Washington. USCR-CBB-20 also possesses resistance to curly top and bean common mosaic, virus diseases which plague cranberry bean production in the Pacific Northwest.