|Miklas, Phillip - Phil|
Submitted to: Bean Improvement Cooperative Proceedings
Publication Type: Proceedings
Publication Acceptance Date: 2/1/2004
Publication Date: 4/1/2004
Citation: Fourie, D., Miklas, P.N., Ariyaranthe, H. 2004. Genes conditioning halo blight resistance to races 1, 7, and 9 occur in a tight cluster. Proceedings of the Bean Improvement Coop, Oct 27-29, Sacramento, CA, 2003. In Annual Report Bean Improv. Coop. 47:103-104. Interpretive Summary:
Technical Abstract: Halo blight is a seed-borne bacterial disease (caused by Pseudomonas syringae pv. phaseolicola) that infects common bean (Phaseolus vulgaris L.) worldwide. Genetic resistance is the most effective control method. A host/pathogen differential series identifies five resistance genes. Our goal is to further characterize and map halo blight resistance genes in bean and tag them for marker-assisted selection (MAS). Three major resistance genes were mapped in a BelNeb-RR-1/A55 mapping population. The Pse-1 gene that conditions resistance to Races 1, 7, and 9 is a putative cluster of individual genes conditioning resistance to Race 1 (Pse-1), Race 7 (Pse-7, a newly proposed symbol) and Race 9 (Pse-9, a newly proposed symbol). The Pse-1 gene cluster is located on linkage group B4 near RAPD marker B10.520. The Pse-4 gene conditions resistance to Race 5 and is also located on linkage group B4, 14.7 cM from the Pse-1 gene cluster. Pse-3 gene conditioned hypersensitive resistance to Races 3 and 4, and as has been reported previously was completely linked to the I gene which conditions hypersensitive resistance to BCMNV on linkage group B2. This is the first report for genomic position of the Pse-1 and Pse-4 genes on linkage group B4 and that a moderate linkage exists between them. Further research is being conducted to verify presence of the Pse-1 ' Pse-7 ' Pse-9 gene cluster.