Location: Corn, Soybean and Wheat Quality ResearchTitle: Improvement of baking quality traits through a diverse soft winter wheat population
Submitted to: Meeting Proceedings
Publication Type: Proceedings
Publication Acceptance Date: 11/18/2016
Publication Date: 12/20/2016
Citation: Sturbaum-Abud, A.K., Chao, S., Penning, B. 2016. Improvement of baking quality traits through a diverse soft winter wheat population. In: The Plant and Animal Genome XXVV Conference Online Program, January 14-18, 2017, San Diego, California. https://pag.confex.com/pag/xxv/meetingapp.cgi/Paper/24267.
Technical Abstract: Breeding baking quality improvements into soft winter wheat (SWW) entails crossing lines based on quality traits, assessing new lines, and repeating several times as little is known about the genetics of these traits. Previous research on SWW baking quality focused on quantitative trait locus and genome-wide association studies but had limited success as quality traits appear to be affected by many genes of small effect with little statistical power to detect locations. Compounding this issue, large sections of the genome lack sufficient recombination to generate populations that reduce candidate genes to a manageable level. A panel of 191 diverse SWW varieties covering a cross-section of breeding stock from the late 1800’s to more modern breeding lines were grown at seven locations/years. The diversity panel had up to a 2-fold difference in baking trait values averaged over location and year. Using the iSelect 9K wheat chip, over 6000 markers have been placed on the SWW diversity panel and a relatedness map of the population developed. Baking quality data has been overlaid on the relatedness map to find groups of varieties with potential for high trait variance and low genetic variance or low trait variance but high genetic variance. These groups of varieties will be further characterized to locate genes that alter baking quality.