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ARS Home » Midwest Area » Wooster, Ohio » Corn, Soybean and Wheat Quality Research » Research » Publications at this Location » Publication #248962

Title: Developing Soybean Lines with Beetle Resistance

item Mian, Rouf

Submitted to: National Entomological Society of America Annual Meeting
Publication Type: Abstract Only
Publication Acceptance Date: 12/18/2009
Publication Date: N/A
Citation: N/A

Interpretive Summary:

Technical Abstract: Biotic stress (e.g., pests and pathogens) is the major cause of yield and quality losses of soybean in Ohio and worldwide. Sources of genetic resistance need to be identified and characterized for many pests. For most pests, genetic resistance is the most cost-effective and environmentally friendly control method. Marker Assisted Breeding (MAB) can reduce time, increase accuracy of selection, and reduce linkage drag in developing soybean cultivars. Coleopteran insects, including Bean leaf beetle (Cerotoma trifurcate) , Mexican bean beetle (Epilachna varivestis), and Japanese beetle (Popillia japonica) are serious pests of soybean in north central USA. These beetles damage soybean plants by direct feeding and some are vectors for soybean viruses. Genetic resistances against these insects are present in germplasm with relatively lower yield than elite cultivars. We have developed a high-yielding beetle resistant indeterminate soybean breeding lines with no yield drag. The data from insect screening and field evaluations for agronomic performances of these soybean lines will be presented.