Submitted to: International Symposium on Septoria/Stagonospora Disease of Cereals
Publication Type: Proceedings
Publication Acceptance Date: 11/26/2003
Publication Date: 12/8/2003
Citation: Liu, Z., Friesen, T.L., Faris, J.D., Meinhardt, S., Ali, S., Rasmussen, J. 2003. Mapping of wheat sensitivity to a partially purified host-selective toxin produced by Stagonospora nodorum. Proceedings of the 6th International Symposium on Septoria/Stagonospora Diseases of Cereals. Dec. 8-12, 2003, Tunis, Tunisia. p. 139-142.
Interpretive Summary: A newly discovered toxin produced by the fungus that causes Stagonospora leaf blotch was partially purified and used to map sensitivity to a wheat chromosome. Both cytogenetic stocks and molecular marker data show the toxin sensitivity locus to be on the short arm of wheat chromosome 1B. Our results indicate that the toxin is a major component of disease.
Technical Abstract: A newly discovered host selective toxin produced by the Stagonospora nodorum isolate Sn2000 was partially purified and used to map sensitivity using cytogenetic stocks and a segregating host population consisting of 108 recombinant inbred lines from the cross of the moderately resistant, toxin sensitive W-7984 and the moderately susceptible toxin-insensitive 'Opata 85'. The W-7984 X Opata 85 population was also used to identify the significance of this toxin in disease. Both cytogenetic stocks and genetic linkage data show the toxin sensitivity locus to be on the short arm of chromosome 1B. Our results indicate that the toxin is a major virulence factor that requires active host metabolism to manifest disease.