New Device Measures Quality in Single Grain
Kernels
By Linda
McGraw November 1, 1999
The first commercially available instrument to quickly detect quality in
single grain kernels has been developed, based on several years of teamwork
between Agricultural Research Service
scientists in Manhattan, Kan., and an Illinois instrument manufacturer.
The Perten SKCS 4170, made and sold by
Perten Instruments in
Springfield, Ill., combines a single kernel hardness tester with near-infrared
(NIR) technology. Perten employees will demonstrate the device Nov. 1-4 at a
meeting of the American Association
of Cereal Chemists in Seattle.
ARS researchers are using the instrument in studies to improve food
quality and safety. They originally designed the single kernel hardness tester
to separate hard and soft wheat. But the instrument can be calibrated to
measure many quality attributes--such as hardness, protein, starch, internal
insect infestation, color or disease--in single kernels. To confirm these
characteristics would ordinarily require time-consuming chemical analysis.
Now, with this first-of-its-kind technology, grain quality can be
checked at a rate of one kernel per second. For instance, if one kernel out of
100 has scab damage, this machine will detect it. Scab is a disease that has
cost some wheat growers billions of dollars in losses. Grain inspectors have
had to rely on subjective visual inspection to assess grain quality. The
infrared portion of the new instrument performs a quick check on each kernel,
measuring quality attributes comprised of carbon, hydrogen, oxygen and
nitrogen.
Finding still more uses for the device, ARS researchers in Manhattan are
showing that the NIR portion of the instrument can be used to differentiate
damaged and sound figs. And the instrument can determine the age of flies,
species of stored grain insects, and whether flies or weevils have been
parasitized. This information is important for improving insect control
programs.
Scientific contact: Floyd
Dowell, ARS
Grain
Marketing and Production Research Center, 1515 College Avenue, Manhattan,
KS, 66502, phone (785) 776-2753, fax (785) 776-2792,
fdowell@usgmrl.ksu.edu.
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