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ARS Home » Plains Area » Fargo, North Dakota » Edward T. Schafer Agricultural Research Center » Cereal Crops Research » Research » Publications at this Location » Publication #370109

Research Project: Improvement of Biotic Stress Resistance in Durum and Hard Red Spring Wheat Using Genetics and Genomics

Location: Cereal Crops Research

Title: Meta-QTL analysis of tan spot resistance in wheat

Author
item LIU, YUAN - North Dakota State University
item SALSMAN, EVAN - North Dakota State University
item WANG, RUNHAO - North Dakota State University
item ZHANG, QIJUN - North Dakota State University
item Fiedler, Jason
item LIU, ZHAOHUI - North Dakota State University
item Xu, Steven
item Faris, Justin
item LI, XUEHUI - North Dakota State University

Submitted to: Theoretical and Applied Genetics
Publication Type: Peer Reviewed Journal
Publication Acceptance Date: 5/9/2020
Publication Date: 5/20/2020
Citation: Liu, Y., Salsman, E., Wang, R., Zhang, Q., Fiedler, J.D., Liu, Z., Xu, S.S., Faris, J.D., Li, X. 2020. Meta-QTL analysis of tan spot resistance in wheat. Theoretical and Applied Genetics. https://doi.org/10.1007/s00122-020-03604-1.
DOI: https://doi.org/10.1007/s00122-020-03604-1

Interpretive Summary: Tan spot is a major foliar disease worldwide in both bread and durum wheat and can reduce grain yield due to a reduction in photosynthetic capacity. Developing and growing resistant cultivars is a cost-effective and environmentally friendly approach to mitigate negative effects of the disease. Understanding the genetic basis of tan spot resistance can enhance the development of resistant cultivars. To do this we performed a meta-analysis to combine the results of 14 previously reported studies that had identified a total of 104 individual tan-spot resistance chromosomal regions. We discovered that these regions could be clustered together into 19 meta-locations and three of which had large genetic effects on multiple races of the pathogen. This information is important to plant breeders so they can focus energy on the most useful non-redundant gene regions for resistance and summarizes the existing information for pathologists looking to understand this disease better.

Technical Abstract: Tan spot, caused by a fungal pathogen Pyrenophora tritici-repentis (Ptr), is a major foliar disease worldwide in both bread wheat and durum wheat and can reduce grain yield due to reduction in photosynthetic area of leaves. Developing and growing resistant cultivars is a cost-effective and environmentally friendly approach to mitigate negative effect of the disease. Understanding the genetic basis of tan spot resistance can enhance the development of resistant cultivars. With that goal, over 100 QTL of resistance to tan spot induced by varied Ptr races and isolates have been identified from previous QTL mapping studies. Meta-QTL analysis can remove redundant QTL amongst various studies and target major QTL for marker-assisted selection in breeding application. In this study, we performed a meta-QTL analysis for tan spot resistance using the reported QTL from 14 previously QTL mapping studies. An integrated linkage map with a total length of 4,080.5 cM and containing 47,309 markers was assembled from 21 individual linkage maps and three previously published consensus maps. Nineteen meta-QTL were clustered from 104 initial QTL projected on the integrated map. Three of the 19 meta-QTL located on chromosomes 2A, 3B, and 5A, respectively, show large genetic effects and confer resistance to multiple races in multiple bread wheat and durum mapping populations. Integrating those race-nonspecific QTL is promising to provide high and stable resistance to tan spot in wheat.