|CHEN, PENGYIN - University Of Arkansas
|RUPE, JOHN - University Of Arkansas
Submitted to: Phytopathology
Publication Type: Abstract Only
Publication Acceptance Date: 5/12/2014
Publication Date: 8/12/2014
Citation: Li, S., Chen, P., Walker, D.R., Rupe, J. 2014. Development of soybean with novel sources of resistance to Phomopsis seed decay. Phytopathology. American Phytopathologu Soceity, August 9 - 13, 2014, Minneapolis, MN.
Technical Abstract: Phomopsis seed decay (PSD) is an important soybean disease that results in poor seed quality in most soybean production areas of the United States. PSD is caused primarily by the fungal pathogen Phomopsis longicolla. In 2009, due to the prevalence of hot and humid environments from pod fill to harvest, PSD caused significant yield losses in 16 southern states. Planting PSD-resistant soybean cultivars would be the most economical and environmentally friendly means of protecting soybean crops from PSD, but few resistant cultivars are currently available. In the past eight years, USDA and university scientists have collaborated to screen hundreds of soybean germplasm accessions, breeding lines, and cultivars for resistance to PSD, and have identified novel sources of resistance. Our current research is focused on development of soybean lines with resistance. In 2013, 17 new cross combinations were made to incorporate resistance genes into high yielding cultivars or breeding lines, and five other crosses were made to develop mapping populations in Arkansas. Crosses were also made in Illinois between elite Midwestern lines and five resistant USDA germplasm accessions to develop breeding lines and potential mapping populations. Analysis of these populations will help us understand the genetics of PSD resistance, identify molecular markers for selection of PSD resistance, and develop high yielding lines with PSD resistance.