Author
LU, YAN - Washington State University | |
HOU, LU - Washington State University | |
WANG, MEINAN - Washington State University | |
JIN, JINXUE - Northwest Agriculture And Forestry University | |
Chen, Xianming |
Submitted to: Meeting Abstract
Publication Type: Abstract Only Publication Acceptance Date: 5/1/2013 Publication Date: 8/24/2013 Citation: Lu, Y., Hou, L., Wang, M., Jin, J., Chen, X. 2013. Mapping QTL for resistance to stripe rust in spring wheat PI 192252 and winter wheat Druchamp. Meeting Abstract. Acta Phytopathologica Sinica 43(2013 Supplement):109. Interpretive Summary: Stripe rust is an important disease of wheat worldwide. High-temperature adult-plant (HTAP) resistance has proven to be durable, but may not be adequate. Spring wheat PI 192252 and winter wheat Druchamp have high-levels of HTAP resistance. To elucidate the genetic basis of HTAP resistance in these genotypes, we conducted molecular mapping studies using a F5 recombinant inbred line (RIL) population for PI 192252 and an F8 RIL population for Druchamp with multi-year and multi-location stripe rust data and simple sequence repeat (SSR) and single nucleotide polymorphism (SNP) markers. We identified two significant quantitative trait loci (QTL) for HTAP resistance in PI 192252. The QTL on the long arm of chromosome 4B explained 40-60% and the one on the short arm of chromosomes 5B explained 22.1-27.4% of the phenotypic variation depending upon the environment. The flanking markers for the 4BL QTL were highly polymorphic across various wheat genotypes. We mapped four QTL for HTAP resistance in Druchamp on chromosomal arms 1BL, 1DS, 4BL, and 5AL, which explained 9-34, 21-38, 11-37, and 12-19% of the phenotypic variation, respectively depending upon the year and location. In addition, three genes for race-specific all-stage resistance were mapped on chromosomal arms 1BS, 5BS, and 6AL in Druchamp. The tightly linked molecular markers should be useful for incorporating the HTAP resistance QTL into commercial cultivars with durable and high level of resistance. Technical Abstract: Stripe rust, caused by Puccinia striiformis f. sp. tritici, is an important disease of wheat worldwide. High-temperature adult-plant (HTAP) resistance has proven to be durable, but may not be adequate. Spring wheat PI 192252 and winter wheat Druchamp have high-levels of HTAP resistance. To elucidate the genetic basis of HTAP resistance in these genotypes, molecular mapping studies were conducted using an F5 recombinant inbred line (RIL) population for PI 192252 and an F8 RIL population for Druchamp using multi-year and multi-location stripe rust data and simple sequence repeat (SSR) and single nucleotide polymorphism (SNP) markers. We identified two significant quantitative trait loci (QTL) for HTAP resistance in PI 192252, collectively explained 74.2 % of the total phenotypic variation. The QTL on the long arm of chromosome 4B explained 40-60% and the one on the short arm of chromosomes 5B explained 22.1-27.4% of the phenotypic variation depending upon the environment. The flanking markers, Xgwm251 and IWA1923, of the 4BL QTL were highly polymorphic across various wheat genotypes. We mapped four QTL for HTAP resistance in Druchamp on chromosomal arms 1BL, 1DS, 4BL, and 5AL, which explained 9-34, 21-38, 11-37, and 12-19% of the phenotypic variation, respectively depending upon the year and location. In addition, three genes for race-specific all-stage resistance were mapped on chromosomal arms 1BS, 5BS, and 6AL in Druchamp. The tightly linked molecular markers should be useful for incorporating the HTAP resistance QTL into commercial cultivars with durable and high level of resistance. |