|CHEN, PENGYIN - University Of Arkansas|
Submitted to: International Scholarly Research Network (ISRN)
Publication Type: Review Article
Publication Acceptance Date: 12/10/2012
Publication Date: 4/23/2013
Citation: Li, S., Chen, P. 2013. Resistance to Phomopsis Seed Decay in soybean. International Scholarly Research Network (ISRN). 2013:1-8.
Interpretive Summary: Soybean Phomopsis seed decay (PSD) causes poor seed quality and suppresses yield in most soybean-growing countries. The disease is caused primarily by a fungus (mold). Hot and humid environmental conditions, especially during the period from the pod fill through harvest stages, favor pathogen growth and disease development. The use of resistant cultivars is the most effective method for controlling PSD. Extensive screening for PSD resistance has resulted in the identification of resistant sources, which is useful for breeding soybean cultivars with high level of resistance to PSD.
Technical Abstract: Phomopsis seed decay (PSD) of soybean is caused primarily by the fungal pathogen, Phomopsis longicolla T.W. Hobbs along with other Phomopsis and Diaporthe spp. This disease causes poor seed quality and suppresses yield in most soybean-growing countries. Infected soybean seeds can be symptomless, but are typically shriveled, elongated, cracked, and have a chalky-white in appearance. Development of PSD is sensitive to environmental conditions. Hot and humid environments favor pathogen growth and disease development. Several control strategies have been used to manage PSD and reduce its impact, however, the use of resistant cultivars is the most effective method for controlling PSD. Efforts have been made to identify sources of PSD resistance in the past decades. At least 28 soybean lines were reported to have certain levels of PSD resistance in certain locations. Inheritance of resistance to PSD has been studied in several soybean lines. In this paper, general information about the disease, the causal agent of pathogens, an overview of research on evaluation and identification of sources of resistance to PSD, and inheritance of resistance to PSD are presented and discussed.