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ARS Home » Plains Area » Fargo, North Dakota » Edward T. Schafer Agricultural Research Center » Sugarbeet and Potato Research » Research » Publications at this Location » Publication #133859


item Friesen, Timothy
item Weiland, John

Submitted to: Mycological Society of America
Publication Type: Abstract Only
Publication Acceptance Date: 5/9/2002
Publication Date: 6/24/2002
Citation: Friesen, T.L., Weiland, J.J. 2002. ELECTROPHORETIC KARYOTYPE OF CERCOSPORA BETICOLA. Mycological Society of America. pg 39-40

Interpretive Summary:

Technical Abstract: Cercospora beticola, causal agent of Cercospora leaf spot is one of the most widespread fungi that affects yield and quality of sugar beet, table beet and Swiss chard. Because the perfect stage of this filamentous fungus is not known it is not possible to carry out classical genetic approaches such as linkage analysis to determine genome size and chromosome number. In an initial characterization of the genome of C. beticola, an electrophoretic karyotype has been done using contour-clamped homogeneous electric field (CHEF) electrophoresis. At least five distinct chromosome sized bands have been resolved in the range of approximately 3.0 to 5.7 megabases. Three of these bands show a higher intensity indicating that multiple chromosomes of equal size may be migrating together. This information will be used as a first step toward a better understanding of the size and structure of the genome of Cercospora beticola.