|Porch, Timothy - Tim|
|URREA, CARLOS - University Of Nebraska|
|BEAVER, JAMES - University Of Puerto Rico|
|PEÑA, P - University Of Nebraska|
|Smith, James - Rusty|
Submitted to: Journal of Plant Registrations
Publication Type: Peer Reviewed Journal
Publication Acceptance Date: 6/17/2011
Publication Date: 1/1/2012
Citation: Porch Clay, T.G., Urrea, C., Beaver, J., Valentin, S., Peña, P.A., Smith, J.R. 2011. Registration of TARS-MST1 and SB-DT1 multiple-stress tolerant black bean germplasm. Journal of Plant Registrations. 6(1):75-80.
Interpretive Summary: High ambient temperature stress, drought stress, root rot diseases, and common bacterial blight cause widespread yield reduction in common bean in low-land tropical environments and in warm temperate environments throughout the world. This complex of environmental and plant pathogen-derived stresses often occur together, and may become more significant due to climate change. However, common bean cultivars that combine tolerance to this complex are not available. The breeding for and release of common bean germplasm with enhanced levels of tolerance to these varied constraints is therefore critical for meeting present and future food security requirements. TARS-MST1 and SB-DT1, were developed by the United States Department of Agriculture-Agricultural Research Service, the University of Nebraska Agricultural Research Division, and the University of Puerto Rico Agricultural Experiment Station. These black bean lines were selected for multiple stress tolerance, including tolerance to high ambient temperature and drought stress, and resistance to bacterial blight and root rot. They incorporate exotic sources of stress tolerance, thus serving to diversify US common beans. These lines can be used by farmers for common bean production in low input environments. In addition, breeding programs can use these germplasm lines in order to improve yield of common bean in existing production regions and in marginal environments.
Technical Abstract: High-ambient-temperature stress, drought stress, root rot disease, and common bacterial blight [CBB; caused by Xanthomonas axonopodis pv. phaseoli (Smith) Dye] cause widespread yield reductions in common bean (Phaseolus vulgaris L.) worldwide. TARS-MST1 (Reg. No. GP-284, PI 661512) and SB-DT1 (Reg. No. GP-283, PI 661970) were developed by the USDA-ARS, the University of Nebraska Agricultural Research Division, and the University of Puerto Rico Agricultural Experiment Station. These black bean lines were selected for tolerance to multiple stresses, including tolerance to high ambient temperature and drought. Specifically, both lines showed significantly higher yields under heat stress compared with the local check and had comparable yields to both heat- and drought-tolerant controls under those stress conditions. TARS-MST1 possesses resistance to CBB, and both lines are tolerant to root rot diseases. They incorporate exotic sources of stress tolerance, thus serving to diversify U.S. common bean germplasm. The lines were characterized for markers related to Bean common mosaic virus and CBB, and both lines carry the I gene, while TARS-MST1 was positive for the presence of two CBB SCAR markers, SU91 and SAP6. The use of this germplasm in breeding programs can serve to improve the yield and stress tolerance of common bean.