|Mcgrath, J mitchell - Mitch|
Submitted to: Crop Science
Publication Type: Peer reviewed journal
Publication Acceptance Date: 10/2/2002
Publication Date: 3/1/2003
Citation: SAUNDERS, J.W., HALLOIN, J.M., MCGRATH, J.M. REGISTRATION OF EL52 AND EL48 SUGARBEET GERMPLASM. CROP SCIENCE. 2003. v. 43(2). p. 744-745. Interpretive Summary: Sugarbeet germplasm enhancement requires continuous selection and improvement of parent materials for inclusion into hybrid varieties. EL52 and EL48 are two germplasm lines that can be used for development of seed parents. Sugarbeet seed parents require a number of specialized genetic features such as monogerm seed and expression of male sterility. EL48 and EL52 are seed parent germplasm that contain resistance to Cercospora leaf spot disease and to seedling damping-off caused by Aphanomyces black root disease. EL52 has been further selected for resistance to Rhizoctonia crown and root rot. These germplasm releases will allow breeders additional materials to develop highly productive sugarbeet varieties resistant to the primary fungal disease problems faced by sugarbeet growers in the Eastern United States.
Technical Abstract: EL52 and EL48 are diploid, multigerm, O-type or near O-type sugarbeet germplasm lines released to industry with improved resistance to blackroot seedling disease caused by Aphanomyces cochlioides Drechs. and Cercospora leafspot disease caused by Cercospora beticola Sacc., two of the most destructive fungal diseases in humid sugarbeet growing regions. EL52 has undergone addition selection for resistance to crown and root rot caused b Rhizoctonia solani Kuhn. Both EL48 and EL52 have shown good agronomic performance and yield characteristics under conditions encountered in the humid, non-irrigated growing regions of Michigan. Genetic material of these releases have been deposited in the National Plant Germplasm System where they will be available for research purposes, including the development and commercialization of new cultivars.