Location: Crop Germplasm ResearchTitle: Grain biodeterioration of sorghum converted lines inoculated with a mixture of Fusarium thapsinum and Curvularia lunata Author
|Radwan, Ghada - Mount Saint Vincent University, Nova Scotia|
|Perumal, Ramasamy - Kansas State University|
|Katile, Seriba - Mali Institute D'Economie|
|Isakeit, Thomas - Texas A&M University|
|Magill, Clint - Texas A&M University|
Submitted to: Plant Pathology Journal
Publication Type: Peer Reviewed Journal
Publication Acceptance Date: 11/21/2016
Publication Date: 1/3/2017
Citation: Prom, L.K., Radwan, G., Perumal, R., Cuevas, H.E., Katile, S., Isakeit, T., Magill, C. 2017. Grain biodeterioration of sorghum converted lines inoculated with a mixture of Fusarium thapsinum and Curvularia lunata. Plant Pathology Journal. 16:19-24.
Interpretive Summary: Worldwide, grain mold is the most important disease of sorghum, especially in areas with frequent rains late in the growing season. The grain molding fungi can cause losses in yield of up to 100%. Seeds infected with grain mold also have lower quality and poor germination. This study identified four converted sorghum lines that are more resistant to the disease than the two resistant checks used in this study. Significant association between grain mold and seed germination was noted, indicating that seeds infected with the disease will have low germination rate. This work suggests that these four lines may be useful in breeding programs to develop grain mold resistance lines which will increase productivity and profitability of sorghum.
Technical Abstract: Globally, grain mold is a major hurdle affecting sorghum productivity and quality. This disease is caused by complex fungal pathogens, among them Fusarium thapsinum and Curvularia lunata are the major fungi prevalent in many sorghum growing regions. This study examined the effect of inoculating a mixture of F. thapsinum and C. lunata on 60 sorghum converted lines with five adapted inbred lines as checks. The overall result showed that SC 725 (PI 534101), SC 218 (PI 534127), SC 691 (PI 534050), SC 91 (PI 534145), and Sureno exhibited grain mold severity of 2.3 or less. This level of grain mold infection was lower than the scores exhibited by the two resistant checks RTx 2911 (2.8) and SC 719-11E (2.5). Significant negative correlation (r = -0.385; P= 0.002) between grain mold and germination indicated the impact of these two fungi infection on germination rates. The significant negative correlation detected between germination and daily maximum temperature during the evaluation period shows planting of sorghum cultivars/hybrids that mature during periods of dry moderate weather will avoid problem of grain mold infection. The identified four converted lines for grain mold resistance in this study is recommended to use in breeding program to introgress grain mold resistance genes into other adapted sorghum inbred lines to increase the yield and seed quality traits.