Submitted to: Meeting Abstract
Publication Type: Abstract Only
Publication Acceptance Date: 1/10/2009
Publication Date: 1/14/2009
Citation: Dubcovsky, J., Fu, D., Uauy, C., Blechl, A.E., Epstein, L., Chen, X., Distelfeld, A., Sela, H., Fahima, T. 2009. Positional Cloning of a QTL for slow rusting in wheat. [online only]. Available: http://www.intl-pag.org/17/abstracts/W61-PAGXVII-426.html. Interpretive Summary:
Technical Abstract: Stripe rust, caused by the fungus Puccinia striiformis f. sp. tritici is a devastating fungal disease in many wheat-growing regions of the world. New strategies to reduce stripe rust yield losses are required to satisfy the increasing world demand for cereals. New virulent races that appeared around the year 2000 are increasing wheat yield losses. Race-specific resistance genes have been deployed by breeders, but they had limited durability. In contrast, non race-specific (i.e. “slow-rusting”) genes generally have a broader spectrum of resistance, are more effective at adult plant stages, provide partial resistance, and usually confer more durable resistance than race-specific genes. Unfortunately, our understanding of non race-specific resistance is limited because none of these genes has yet been cloned. We have recently completed the positional cloning of the slow rusting gene Yr36. This gene is effective only under relatively high temperatures and provides partial resistance to stripe rust. Yr36 has a novel gene architecture. The gene has been lost during domestication and therefore has the potential to contribute to the improvement of stripe rust resistance in a wide range of germplasm.