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United States Department of Agriculture

Agricultural Research Service

Research Project: REDUCING SOYBEAN YIELD LOSSES THROUGH GENETIC IMPROVEMENT

Location: Crop Genetics Research Unit

Title: Phomopsis seed decay of soybean

Author
item Li, Shuxian

Submitted to: Intech
Publication Type: Book / Chapter
Publication Acceptance Date: October 24, 2010
Publication Date: April 15, 2011
Citation: Li, S. 2011. Phomopsis seed decay of soybean. Intech. 277-292.

Technical Abstract: Soybean Phomopsis seed decay (PSD) causes poor seed quality and suppresses yield in most soybean-growing countries. The disease is caused primarily by the fungal pathogen Phomopsis longicolla along with other Phomopsis and Diaporthe spp. Infected seed range from symptomless to shriveled, elongated, cracked, and often appear chalky-white. Seed quality is poor due to reduction in seed viability and oil content, alteration of seed composition, and increased frequencies of moldy and/or split beans. Hot and humid environmental conditions, during the period from pod fill through harvest stages, favor pathogen growth and disease development. The use of resistant cultivars is the most effective method for controlling PSD. In this book chapter, general information about PSD and an overview of research on the identification and characterization of the PSD-causing pathogens, germplasm screening, and genetics resistance are presented and discussed.

Last Modified: 7/31/2014
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