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ARS Home » Research » Publications at this Location » Publication #79944
Title: ADVANTAGES OF LOW TEMPERATURE SCANNING ELECTRON MICROSCOPY (SEM) TO RECORD OBSERVATIONS OF UNIQUE SPECIMENS

Author
item Wergin, William
item Hoberg, Eric
item Erbe, Eric

Submitted to: Society of Nematology Meeting
Publication Type: Abstract Only
Publication Acceptance Date: 4/30/1997
Publication Date: N/A
Citation: N/A

Interpretive Summary:

Technical Abstract: Systematic nematologists who wish to use scanning electron microscopy (SEM) to help describe nematode features, are frequently confronted by three problems: 1) the number of specimens may be extremely limited; 2) the specimens are commonly shipped in alcohol and would be partially dehydrated and; 3) conventional preparation procedures, such as chemical fixation, dehydration and critical point drying often cause considerable shrinkage and distortion. To eliminate these problems a protocol was developed that enabled multiple orientations of a single specimen. In brief, a single specimen could be rehydrated, frozen to a specimens holder and observed by low temperature SEM. Following these observations, the specimen could be removed from the instrument, thawed, reoriented and refrozen for further observation.