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ARS Home » Midwest Area » Columbia, Missouri » Cropping Systems and Water Quality Research » Research » Publications at this Location » Publication #151571
Title: FROM SENSORS TO INFORMATION: CLEANING YIELD MONITOR DATA

Author
item Drummond, Scott
item Sudduth, Kenneth - Ken

Submitted to: InfoAg Conference
Publication Type: Proceedings
Publication Acceptance Date: 7/30/2003
Publication Date: 7/31/2003
Citation: DRUMMOND, S.T., SUDDUTH, K.A. FROM SENSORS TO INFORMATION: CLEANING YIELD MONITOR DATA. INFOAG CONFERENCE. 2003. http://www.farmresearch.com/infoag/ProgramDesigner/ia_ShowFile.asp?MatID=22

Interpretive Summary:

Technical Abstract: Yield mapping is a critical component of precision farming. However, yield monitoring systems produce complex, error-filled data sets. These errors must be removed or at least well understood, as they can have serious consequences when the data are used for analysis tasks. Even when the data are used in an interpretive fashion, the quality of the conclusions drawn by the user may be significantly and negatively affected by these errors. This presentation is designed to assist users of yield maps to: identify common error sources in yield monitor data; understand the scope and magnitude of the errors in the resulting yield maps; and to recognize and select appropriate techniques for removing and/or reducing the effects of these errors. Particular attention is focused on error types that occur most frequently and/or have the potential to produce the most harmful effects. Participants will have the opportunity to test an experimental software tool designed to remove errors from yield data. Feedback from the participants will be used to assist with the beta development of this tool.