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ARS Home » Midwest Area » Columbia, Missouri » Plant Genetics Research » Research » Publications at this Location » Publication #118033
Title: QUANTITATIVE TRAIT LOCI FOR CORN EARWORM RESISTANCE

Author
item McMullen, Michael

Submitted to: Plant and Animal Genome VX Conference Abstracts
Publication Type: Abstract Only
Publication Acceptance Date: 1/13/2001
Publication Date: 1/13/2001
Citation: MCMULLEN, M.D. QUANTITATIVE TRAIT LOCI FOR CORN EARWORM RESISTANCE. PLANT AND ANIMAL GENOME ABSTRACTS. 2001. ABSTRACT. P. 46.

Interpretive Summary:

Technical Abstract: The development of molecular markers for crop plants has enabled research on the genetic basis of quantitative traits. However, despite a decade of these studies called quantitative trait locus (QTL) analyses, the molecular basis for variation in agronomic traits is still largely unknown. Our research group is addressing this deficiency by studying a model system for rQTL analysis, the genetic basis of resistance to the corn earworm in maize silks. Our results indicate: 1) The importance of transcription factors as genes underlying QTL. 2) The importance of the interconnections of biochemical pathways and substrate flow in understanding QTL effects. 3) The importance and biological bases of epistasis for QTL.