Submitted to: Agronomy Abstracts
Publication Type: Abstract Only
Publication Acceptance Date: 10/29/1995
Publication Date: N/A
Citation: N/A Interpretive Summary:
Technical Abstract: The development of high temperature-tolerant wheat (Triticum aestivum L.) germplasm is necessary to improve plant productivity under high-temperature stress environments. This study was conducted to determine the genetic control of acquired high temperature tolerance in common bread wheat cultivars. Reduction of 2,3,5-triphenyltetrazolium chloride (TTC) by heat- stressed seedling leaves was used as a quantitative measure to characteriz acquired high temperature tolerance. Eleven-day-old seedlings of 20 F1 progeny produced through a complete 5 x 5 ('Payne', 'Siouxland', 'Sturdy', 'TAM W-101', and 'TAM 108') diallel mating design were acclimated at 37 deg C for 24 hours, followed by a 2-hour incubation at 50 deg C. Under these test conditions, acquired high temperature tolerance ranged from a high of 75.7% for the genotype TAM W-101 X TAM 108, to a low of 37.3% for the genotype Payne X Siouxland. These results suggest that enhancing the level of high temperature tolerance in wheat germplasm is feasible utilizing existing levels of genetic variability and exploiting additive genetic effects associated with high temperature tolerance.