Location: Crop Genetics Research
Title: Developing and releasing improved soybean lines with resistance to Phomopsis seed decay and low seed damageAuthor
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Li, Shuxian |
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Smith, James |
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Submitted to: Meeting Abstract
Publication Type: Abstract Only Publication Acceptance Date: 4/30/2025 Publication Date: N/A Citation: N/A Interpretive Summary: Technical Abstract: Phomopsis seed decay (PSD) is one of the most economically important seed diseases resulting in poor quality of soybean (Glycine max) seed. Diaporthe longicolla (syn. Phomopsis longicolla) is the primary cause of PSD. Control of PSD is best accomplished by planting PSD-resistant cultivars. Multiple exotic soybean accessions from the USDA soybean germplasm collection were screened for more than a decade for reaction to PSD at Stoneville, Mississippi. Seeds from inoculated and non-inoculated plots harvested either promptly at maturity, or after a two-week delay in harvest, were assessed for infection by D. longicolla. Selected resistant accessions were used to develop improved breeding lines with resistance to PSD and low seed damage over multiple cycles. Breeding line DS43-72, with combined resistance from both PIs 417050 and 587982A, had low scores for PSD and seed damage, while DS65-1, deriving resistance from PI 587982A, had the lowest seed damage score and the highest seed germination among all lines tested. Improved seed quality lines DS31-243 (PI 700941) and DS1260-2 (PI 705148), derived from PI 587982A, and DS49-142 (PI 703498), derived from PI 603756, were publicly released by the USDA. This research has led to the release of improved germplasm lines with PSD resistance and high seed quality, which benefits soybean producers and the industry at large. |
