Genetic and phenotypic responses of temperature-independent Hessian fly resistant durum wheat to larval attack during heat stress

Authors: Subramanyam, Subhashree; Nemacheck, Jill; SUETSUGU, TAYLOR - Purdue University; Flynn, Rachel; FAIK, AHMED - Ohio University

Submitted to: BMC Plant Biology
Publication Type: Peer Reviewed Journal
Publication Acceptance Date: 2/9/2025
Publication Date: 2/17/2025
Citation: Subramanyam, S.N., Nemacheck, J.A., Suetsugu, T., Flynn, R.D., Faik, A. 2025. Genetic and phenotypic responses of temperature-independent Hessian fly resistant durum wheat to larval attack during heat stress. BMC Plant Biology. https://doi.org/10.1186/s12870-025-06226-1.
DOI: https://doi.org/10.1186/s12870-025-06226-1

Interpretive Summary: Hessian fly is a major pest of wheat that causes severe economic damages. Increased environmental temperature further worsens this problem as heat stress breaks down wheat plant resistance to Hessian fly. Using wheat lines that maintain Hessian fly resistance at higher temperatures offer a valuable resource to wheat producers within the U.S and around the globe as a strategy to control this insect pest. In this study, we have identified genetic differences between pasta wheat lines that remain resistant at high temperatures and those that become susceptible at high temperatures to identify factors involved in resistance and susceptibility of wheat to Hessian fly larval feeding following heat stress.

Technical Abstract: Background Wheat production is increasingly challenged by the devastating damage caused by insect pests. The advent of global warming is further exacerbating this threat. Hessian fly (Mayetiola destructor), a dipteran gall midge, is a destructive pest of host wheat (Triticum aestivum) having severe economic consequences. Planting wheat cultivars harboring resistance genes is the most effective and economical Hessian fly management strategy. However, heat stress poses a challenge to this strategy, as elevated temperature breaks down Hessian fly resistance in wheat. Our prior study identified T. turgidum (durum wheat) accessions that exhibited resistance to Hessian fly when challenged with increased temperature of 30'C. In this study, we carried out follow up characterization of these durum lines to highlight molecular components involved during Hessian fly resistance or susceptibility in wheat following heat stress. Results Temperature-independent resistant durum lines were greater than 70% resistant to multiple Hessian fly biotypes at the elevated temperature of 30'C. At the molecular level, these lines showed increased transcripts of Hfr-1, a gene encoding an antinutrient lectin, unlike the heat-triggered susceptible durum wheat. The Hessian fly susceptibility-associated biomarker genes were significantly upregulated in the durum wheat with heat-triggered susceptibility at 30'C, resembling the gene expression profile observed in susceptible wheat. None of these susceptibility-associated genes were differentially expressed in the temperature-independent resistant wheat. The genes involved in oxidative stress and jasmonic acid pathways did not reveal any specific expression pattern attributed to either heat stress or larval feeding. Neutral red staining revealed limited cell wall permeability in the temperature-independent resistant wheat, unlike the heat-triggered susceptible durum plants that were highly permeable like the susceptible wheat. Conclusions Temperature-independent resistant durum wheat lines provided robust resistance to multiple Hessian fly biotypes at higher temperatures. These lines offer a valuable resource for wheat producers for providing resistance following heat stress.