|Wise, Kiersten - Purdue University|
|Hushes, Teresa - Monsanto Corporation|
Submitted to: Meeting Abstract
Publication Type: Abstract Only
Publication Acceptance Date: 5/5/2017
Publication Date: N/A
Technical Abstract: Sudden death syndrome is one of the leading biotic stresses responsible for soybean yield loss in major soybean production areas. In North America, the disease is caused by the fungus Fusarium virguliforme, while in South America additional Fusarium species cause similar symptoms. Breeding for SDS resistance is being carried out by multiple academic and industrial sources. However, only limited information of the population structure of F. virguliforme is available, which hampers the breeding effort. The objective of current study is to build a genome-wide informative microsatellite database and use it to characterize the pathogen population structure in a global isolate collection. We developed a novel bioinformatics pipeline to scan the genome assemblies of multiple isolates of this fungus and created a database of informative microsatellite loci, thus bypassing / minimizing the step required to test the information content of microsatellite loci identified through sequencing of microsatellite-enriched library or genome scanning of a single assembly. Primers were designed for these loci. DNA is being extracted from a world-wide collection of 83 isolates. The microsatellite markers will be used to characterize the global population structure of this fungus.