|Van Horn, Christopher|
|CHANG, CHUNG-JAN - University Of Georgia|
Submitted to: Genome Announcements
Publication Type: Peer Reviewed Journal
Publication Acceptance Date: 12/1/2016
Publication Date: 2/9/2017
Citation: Van Horn, C.R., Chang, C., Chen, J. 2017. De Novo whole genome sequence of Xylella fastidiosa subsp. multiplex strain BB01 from blueberry in Georgia, USA. Genome Announcements. doi:10.1128/genomeA.01598.16.
Interpretive Summary: Xylella fastidiosa causes blueberry bacterial leaf scorch (BBLS) disease in USA. In the state of Georgia, blueberry is a leading commodity fruit, but production is now threatened by the newly found BBLS disease. The draft genome sequence of X. fastidiosa strain BB01 isolated from blueberries in Georgia, USA, is reported. The BB01 genome sequence adds new information to the current Xylella sequence database and will facilitate further biological characterization of this fastidious bacterium and provide new information for effective disease control.
Technical Abstract: This study reports a de novo assembled draft genome sequence of Xylella fastidiosa subsp. multiplex strain BB01 causing blueberry bacterial leaf scorch in Georgia, USA. The BB01 genome is 2,517,579 bp with a G+C content of 51.8% and 2,943 open reading frames (ORFs) and 48 RNA genes.