Location: Plant Science ResearchTitle: ‘TAM 112’ Wheat, resistant to greenbug and wheat curl mite and adapted to the dryland production system in the Southern High Plains) Author
|Seabourn, Bradford - Brad|
Submitted to: Journal of Plant Registrations
Publication Type: Peer Reviewed Journal
Publication Acceptance Date: 6/6/2014
Publication Date: 8/25/2014
Citation: Rudd, J., Devkota, R., Baker, J., Peterson, G., Lazar, M., Bean, B., Worrall, D., Baughman, T., Marshall, D.S., Sutton, R., Rooney, L., Nelson, L., Fritz, A., Weng, Y., Morgan, G., Seabourn, B.W. 2014. ‘TAM 112’ Wheat, resistant to greenbug and wheat curl mite and adapted to the dryland production system in the Southern High Plains. Journal of Plant Registrations. 8(3):291-297. Interpretive Summary: The new wheat variety ‘TAM 112’ is well-adapted for production in the southern High Plains of the U.S. The variety is resistant to two important insect pests, the greenbug and wheat curl mite.
Technical Abstract: ‘TAM 112’ (PI 643143), a hard red winter wheat (Triticum aestivum L.) is an F4 derived line from the cross U1254-7-9-2-1/TXGH10440. U1254-7-9-2 is a USDA-ARS germplasm line from the Plant Science and Entomology Research unit, Manhattan, Kansas. It was developed from the cross TAM 200/TA2460. TA2460 is an Aegilops tauschi (one of the progenitor species of modern hexaploid wheat) lines that was identified as having a unique gene for leaf rust resistance (this gene has since been designated Lr41). TXGH10440 was a selection from the same population that TAM 110 was selected from. TXGH10440 carries Gb2 gene for greenbug resistance from the germplasm line Amigo and Gb3 from the synthetic hexaploid line name Largo. The F3 and F4 generations were grown as bulk populations on the TAES farm at Chillicothe in 1995 (year of harvest) and 1996, respectively. The line that became TAM 112 was visually selected for its agronomic characteristics and was grown as a single plot in 1998 and in replicated trials thereafter. The selection criteria were forage potential and grain yield.