Location: Sugarbeet and Bean ResearchTitle: Response of sugar beet recombinant inbred lines to post-harvest rot fungi Author
Submitted to: Annual Beet Sugar Development Foundation Research Report
Publication Type: Research Notes
Publication Acceptance Date: 5/1/2014
Publication Date: 6/1/2014
Citation: Hanson, L.E., Beaudry, R.M., McGrath, J.M., Goodwill, T.R. 2014. Response of sugar beet recombinant inbred lines to post-harvest rot fungi. [CD-ROM]. 2013 Annual Beet Sugar Development Foundation Research Report. Denver, Colorado: Beet Sugar Development Foundation.
Technical Abstract: Sugar beet is commonly stored in outdoor piles prior to processing. During this storage period the crop is subject to multiple post-harvest rots. Resistance to three post harvest rots was identified in two sugar beet germplasm in the 1970s, but there has been little work done on host resistance to post-harvest storage pathogens in recent years. In recent survey work in Michigan, several fungi known to cause post harvest rot were found. The results varied from previous surveys in that little Phoma was isolated from beets out of storage piles. The most commonly isolated pathogens were Botrytis cinerea and Penicillium species, followed by Fusarium species. To look for variable responses to storage rots, recombinant inbred lines (RILs) and other USDA germplasm of sugar beet that have been developed in Michigan were screened for susceptibility to biotic post-harvest deterioration. Significant differences (P<0.05) were found in the response to two of the three pathogens tested in the USDA germplasm. One of these germplasms showed reduced rot with Fusarium graminearum in 2014 compared to the control, and this same germplasm had less rot with F. graminearum in testing in 2013. In addition, it showed reduced rot following exposure to Phoma betae.