Location: Plant Science ResearchTitle: Registration of fusarium head blight-resistant soft red winter wheat germplasm VA04W-433 and VA04W-474
|CHEN, JIANLI - University Of Idaho|
|GRIFFERY, CARL - Virginia Polytechnic Institution & State University|
|LIU, SHUYU - Texas A&M University|
|SAGHAI MAROOF, M - Virginia Polytechnic Institution & State University|
|MURPHY, J - North Carolina State University|
|NAVARRO, RENE - North Carolina State University|
|SNELLER, CLAY - The Ohio State University|
Submitted to: Journal of Plant Registrations
Publication Type: Peer Reviewed Journal
Publication Acceptance Date: 10/15/2011
Publication Date: 11/9/2011
Citation: Chen, J., Griffery, C.A., Liu, S., Saghai Maroof, M.A., Murphy, J.P., Navarro, R.A., Sneller, C.H., Brown Guedira, G.L., Souza, E.J. 2011. Registration of fusarium head blight-resistant soft red winter wheat germplasm VA04W-433 and VA04W-474. Journal of Plant Registrations. 6(1):111-116.
Interpretive Summary: In this manuscript, a description is given of two adapted soft red winter (SRW) wheat lines, VA04W-433 (Reg. No. GP-943, PI 657945) and VA04W-474 (Reg. No. GP-944, PI 657946), having resistance to fusarium head blight (FHB), also known as scab. The sources for resistance are two exotic lines, Ning 7840 and W14. VA04W-433 and VA04W-474 have been widely used as adapted FHB-resistant parents in SRW wheat production regions, such as North Carolina, Kentucky, Georgia, and Illinois.
Technical Abstract: 'Fusarium head blight [FHB; caused by Fusarium graminearum Schwabe; telomorph Gibberella zeae (Schwein.) Petch] is one of the major diseases of winter wheat (Triticum aestivum L.) in the U.S. mid-Atlantic region. The objective of this research was to develop adapted soft red winter (SRW) wheat germplasm having enhanced resistance to FHB for this region. The SRW wheat germplasm lines VA04W-433 (Reg. No. GP-943, PI 657945) and VA04W-474 (Reg. No. GP-944, PI 657946) are two adapted FHB-resistant lines developed by the Virginia Agricultural Experiment Station and released in 2009. VA04W-433 was derived from a three-way cross of ‘Ning 7840’/Pioneer brand ‘2684’//VA96-54-244. VA04W-474 is a doubled haploid line derived from the F1 of the three-way cross ‘Roane’//W14/‘Coker 9134’ using a wheat-by-maize hybridization method. The resistance was derived from known Chinese resistance sources Ning 7840, in VA04W-433 and, W14, in VA04W-474 and selected through intensive phenotypic screening. The resistance was confirmed with molecular markers on chromosome 3BS and 5AS. Both lines have better grain volume weight, better resistance to deoxynivalenol accumulation caused by FHB infection, and better resistance to leaf rust (caused by Puccinia triticina Eriks.) than the resistant check ‘Ernie’.