Submitted to: American Society of Beet Sugar Technologists Proceedings
Publication Type: Proceedings
Publication Acceptance Date: 3/3/2013
Publication Date: 6/14/2013
Citation: Hanson, L.E., Beaudry, R.M., Goodwill, T.R., McGrath, J.M. 2013. Response of sugar beet (Beta vulgaris) recombinant inbred lines to post-harvest rot fungi. IN: Proceedings of the American Society of Beet Sugar Technologists. 37th Biennial Meeting, February 27 - March 3, 2013, Anaheim, California. 2013 CD-ROM.
Technical Abstract: Sugar beet (Beta vulgaris) is commonly stored in outdoor piles prior to processing for food and animal feed. During this storage period the crop is subject to multiple post-harvest rots. Resistance to three post harvest rots was identified in two sugar beet germplasm in the 1970s, but there has been little work done on host resistance to post-harvest storage pathogens in recent years. In recent survey work in Michigan, several fungi known to cause post harvest rot were found. Recombinant inbred lines (RILs) of sugar beet have recently been developed, and these were screened for susceptibility to biotic post-harvest deterioration. Significant differences (P < 0.05) were found in this population for responses to three pathogens: Botrytis cinerea, Penicillium claviforme, and Rhizopus stolonifer. The response in several RILs varied depending upon the length of time in storage. A poor correlation between reduced damage by these pathogens suggests independent genetic control of susceptibility. There is the potential to develop materials that may be less damaged by post harvest rot pathogens for the North Central US growing region, as well as gaining a better understanding of the interaction between fungal storage rot pathogens and host genotype.