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Title: Registration of USG 3209/Jaypee Wheat Recombinant Inbred Line Mapping Population

Author
item HALL, M - VIRGINIA POLYTECHNIC INSTITUTION & STATE UNIVERSITY
item TUCKER, D - VIRGINIA POLYTECHNIC INSTITUTION & STATE UNIVERSITY
item GRIFFEY, C - VIRGINIA POLYTECHNIC INSTITUTION & STATE UNIVERSITY
item LIU, S - VIRGINIA POLYTECHNIC INSTITUTION & STATE UNIVERSITY
item SNELLER, C - THE OHIO STATE UNIVERSITY
item GUTTIERI, M - THE OHIO STATE UNIVERSITY
item VAN SANFORD, D - UNIVERSITY OF KENTUCKY
item COSTA, J - UNIVERSITY OF MARYLAND
item MARSHALL, DAVID
item Brown-Guedira, Gina

Submitted to: Journal of Plant Registrations
Publication Type: Peer Reviewed Journal
Publication Acceptance Date: 1/2/2010
Publication Date: 5/1/2010
Citation: Hall, M.D., Tucker, D., Griffey, C.A., Liu, S., Sneller, C., Guttieri, M., Van Sanford, D., Costa, J., Marshall, D.S., Brown Guedira, G.L. 2010. Registration of USG 3209/Jaypee Wheat Recombinant Inbred Line Mapping Population. Journal of Plant Registrations. 4:159-162

Interpretive Summary: ‘USG 3209’/‘Jaypee’ (Reg. No. MP-3, NSL 465777 MAP), is a soft red winter wheat recombinant inbred line (RIL) population developed by Virginia Polytechnic Institute and State University and submitted to the USDA–ARS National Small Grains Germplasm Research Facility in Aberdeen, ID, in 2008. This mapping population is composed of 130 F11:12 RILs and has been used to study the genetics of adult plant resistance to powdery mildew and leaf rust and soft winter wheat milling and baking quality. Genetic linkage maps of this population were created to identify quantitative trait loci governing these traits. The genetic marker data collected on this population has been submitted to the GrainGenes database (http://wheat.pw.usda.gov) and includes data from both microsatellite and Diversity Array Technology markers.

Technical Abstract: ‘USG 3209’/‘Jaypee’ (Reg. No. MP-3, NSL 465777 MAP), is a soft red winter wheat (Triticum aestivum L.) recombinant inbred line (RIL) population developed by Virginia Polytechnic Institute and State University and submitted to the USDA–ARS National Small Grains Germplasm Research Facility in Aberdeen, ID, in 2008. This mapping population is composed of 130 F11:12 RILs and has been used to study the genetics of adult plant resistance to powdery mildew [Blumeria graminis (DC) E.O. Speer] and leaf rust (Puccinia triticina Eriks.), and soft winter wheat milling and baking quality. Genetic linkage maps of this population were created to identify quantitative trait loci governing these traits. The genetic marker data collected on this population has been submitted to the GrainGenes database (http://wheat.pw.usda.gov) and includes data from both microsatellite and Diversity Array Technology markers.