Author
CARTER, A - UNIV OF IDAHO | |
HANSEN, J - UNIV OF IDAHO | |
KOEHLER, T - UNIV OF IDAHO | |
Chen, Xianming | |
ZEMETRA, R - UNIV OF IDAHO |
Submitted to: Agronomy Society of America, Crop Science Society of America, Soil Science Society of America Meeting
Publication Type: Abstract Only Publication Acceptance Date: 9/1/2005 Publication Date: 11/1/2005 Citation: Carter, A., Hansen, J., Koehler, T., Chen, X., Zemetra, R. Development of a recombinant inbred line (ril) population in soft white winter wheat. Crop Science Annual Meeting, Nov. 7-10, 2005, Salt Lake City, UT. Interpretive Summary: Technical Abstract: Recombinant inbred line (RIL) populations are very useful to develop molecular markers in wheat. One market class that has been under-represented in RIL populations has been soft white winter wheat. A RIL population of 314 individuals was developed using a cross between Brundage and Coda. Brundage is an awnless, common, soft white winter wheat. Coda is an awned, club, soft white winter wheat. These two parents differ for many agronomic and quality traits including dwarfing genes, stripe rust resistance, and yield potential. In the 2003-2004 growing season, F6 derived F7 lines were planted in headrows for seed increase. During the 2004-2005 growing season the 314 individual lines plus parental controls were planted in a completely randomized block design with four replicates at two locations. Data was collected on agronomic traits through the growing season. The experiments were treated with a fungicide to minimize confounding yield data with stripe rust resistance. Response to stripe rust was evaluated in separated untreated trials. Differences were observed for both qualitative and quantitative traits in the RIL population. Heritablilities for traits was calculated by dividing the additive genetic variance by the total phenotypic variance. Data collected will be used to find associations between the trait of interest in soft white winter wheat and molecular markers to facilitate MAS in this market class in the future. |