|Pastor corrales, Marcial - Talo|
Submitted to: Germplasm Release
Publication Type: Germplasm release
Publication Acceptance Date: 7/28/2004
Publication Date: 10/11/2004
Citation: Mutlu, N., Miklas, P.N., Steadman, J.R., Vidaver, A.K., Lindgren, D.T., and Pastor-Corrales, M.A. 2004. Notice of Release of New Pinto Bean (Phaseolus vulgaris L.) Germplasm Lines ABCP-8, ABCP-15, and ABCP-17. The University of Nebraska and Agr. Res. Serv.-U.S. Dept. of Agric. Germplasm Release Notice. 4 p. Interpretive Summary: The 0.5 million acres of pinto beans grown in the U.S. east of the continental divide are often severely attacked by common bacterial blight, a seed-transmitted disease that causes up to 40% yield loss in susceptible cultivars as well as reduction of seed quality through discoloration of infected seed. Development of cultivars with genetic resistance combined from different sources is the most cost effective method to control common bacterial blight disease. The University of Nebraska, with significant contribution from USDA,ARS, announces the release of germplasm lines with the highest level of resistance to common bacterial blight developed to date for the pinto beans. The germplasm lines ABCP-8, ABCP-15, and ABCP-17 combine common blight resistance from two diverse sources. In addition to common blight resistance they possess resistance to halo bacterial blight, bean rust, and bean common mosaic virus all of which are problematic diseases in the major bean production regions of the U.S. However, ABCP-8, ABCP-15, and ABCP-17 will be used by plant breeders to improvine resistance to common bacterial blight in the pinto beans.
Technical Abstract: Pinto bean germplasm lines ABCP-8, ABCP-15, and ABCP-17 were developed by the Nebraska Agricultural Experimental Station in collaboration with USDA-ARS. These lines were bred specifically for enhanced resistance to common bacterial blight caused by Xanthomonas campestris pv. phaseoli (Smith) Dye. The ABCP-8, ABCP-15, and ABCP-17 lines are the first pinto beans to combine the common bacterial blight resistance from XAN 159 with that of great northern Montana No. 5 source. Combined resistance was confirmed by the presence of previously developed DNA SCAR markers SU91 and SAP6 tightly linked with quantitative trait loci (QTL) from XAN 159 and Montana No. 5, respectively. In addition to common bacterial blight resistance, these three lines are resistant to halo blight races 6 and 7, possess Ur-3 gene for resistance to bean rust, and the bc-12 gene for resistance to Bean common mosaic virus (BCMV). ABCP-8 exhibited greater resistance to common bacterial blight (6% infection in field and greenhouse tests) than the recurrent parent Chase (33% field and 46% greenhouse) and susceptible check Othello (59% field and 100% greenhouse), and similar resistance to the donor parent XAN 159 (8% in field and 5% in greenhouse). ABCP-15 and ABCP-17 exhibited slightly less resistance to common bacterial blight in field (12%) and greenhouse (12%) tests than ABCP-8.