|Pastor Corrales, Marcial - Talo|
Submitted to: Crop Science
Publication Type: Peer Reviewed Journal
Publication Acceptance Date: 1/13/2005
Publication Date: 3/3/2005
Citation: Mutlu, N., Miklas, P.N., Steadman, J.R., Vidaver, A.K., Lindgren, D.T., Reiser, J., Pastor Corrales, M.A. 2005. Registration of common bacterial blight resistant pinto bean germplasm line abcp-8. Crop Science. 45 (3): 806-807. Interpretive Summary: The 0.5 million acres of pinto beans grown in the U.S. east of the continental divide are often severely attacked by common bacterial blight, a seed-transmitted disease that causes up to 40% yield loss in susceptible cultivars as well as reduction of seed quality through discoloration of infected seed. Development of cultivars with genetic resistance combined from different sources is the most cost effective method to control common bacterial blight disease. The University of Nebraska, with significant contribution from USDA,ARS, announces the release of germplasm lines with the highest level of resistance to common bacterial blight developed to date for pinto beans. The germplasm line ABCP-8 combine common blight resistance from two diverse sources. In addition to common blight resistance they possess resistance to halo bacterial blight, bean rust, and bean common mosaic virus all of which are problematic diseases in the major bean production regions of the U.S. ABCP-8 will be used by plant breeders to improve resistance to common bacterial blight in the pinto beans.
Technical Abstract: Pinto bean (Phaseolus vulgaris L.) germplasm line ABCP-8 was developed by the Nebraska Agricultural Experimental Station in collaboration with USDA-ARS. This line was bred specifically for enhanced resistance to common bacterial blight caused by Xanthomonas campestris pv. phaseoli (Smith) Dye. ABCP-8 is the first pinto bean to combine the common bacterial blight resistance from XAN 159 with that of great northern Montana No. 5 source. Combined resistance was confirmed by the presence of previously developed DNA SCAR markers SU91 and SAP6 tightly linked with quantitative trait loci (QTL) from XAN 159 and Montana No. 5, respectively. In addition to common bacterial blight resistance, this line is resistant to halo blight races 6 and 7, possess Ur-3 gene for resistance to bean rust, and the bc-12 gene for resistance to Bean common mosaic virus (BCMV). ABCP-8 exhibited greater resistance to common bacterial blight (6% infection in field and greenhouse tests) than the recurrent parent Chase (33% field and 46% greenhouse) and susceptible check Othello (59% field and 100% greenhouse), and similar resistance to the donor parent XAN 159 (8% in field and 5% in greenhouse).