|Mcgrath, J Mitchell - Mitch|
Submitted to: Annual Beet Sugar Development Foundation Research Report
Publication Type: Experiment Station
Publication Acceptance Date: 5/1/2004
Publication Date: 6/30/2004
Citation: McGrath, J.M., Duckert, T.M., Koppin, T.K. 2004. Cercospora leafspot evaluation and selection. 2003 Annual Beet Sugar Development Foundation Research Report. p. D8.
Technical Abstract: The Cercospora leafspot selection test was conducted to select additional resistance in the germplasm release EL50, and consisted of eight 300 ft rows with alternate rows of EL50 and L19/SR95 as a spreader row. Both L19 and SR95 are highly susceptible to Cercospora leaf spot caused by Cercospora beticola. Plots were inoculated with spores with generous assistance of Monitor Sugar Company, and disease pressure was high in this selection plot. Forty-one EL50 roots showing minimal leaf spot symptoms (< 2 spots per mature leaf) relative to its ca. 2,400 siblings were selected for 2004 seed production at East Lansing. Seed from this increase will be evaluated in 2004 and, if warranted, released as improved germplasm.