|Montalvo Jr, Joseph|
|Von Hoven, Terri|
Submitted to: Proceedings of the International Textile Manufacturers Federation Meeting
Publication Type: Abstract Only
Publication Acceptance Date: 7/14/2006
Publication Date: 9/1/2006
Citation: Montalvo Jr, J.G., Von Hoven, T.M., Hequet, E., Thibodeaux, D.P. 2006. Exploring the image analysis database. The fundamentals. Proceedings of the International Textile Manufacturers Federation Meeting. Appendix FM4:78-89. Interpretive Summary:
Technical Abstract: A database of the image analysis measured properties wall area, perimeter and theta has been compiled for 104 cottons. From these measured properties, maturity and fineness values can be calculated. One predicted use of this database is that of a reference that will be used to calibrate indirect methods of measuring maturity and fineness. In order to be as useful as possible, the database must be explored for random and systematic components of error, and tested for any outliers. In addition, the micronaire calculated from image analysis properties will be compared to the HVI measured micronaire.