Skip to main content
ARS Home » Research » Publications at this Location » Publication #149204


item Doraiswamy, Paul
item Hatfield, Jerry
item Prueger, John
item Stern, Alan

Submitted to: International Geoscience and Remote Sensing Symposium Proceedings
Publication Type: Proceedings
Publication Acceptance Date: 3/16/2003
Publication Date: 7/21/2003
Citation: Doraiswamy, P.C., Hatfield, J.L, Prueger, J.H., Stern, A.J., Akhmedov, B., 2003. MODIS application for mapping regional crop yields. In: Proceeding of IEEE International Geoscience and Remote Sensing Symposium, July 21-25, 2003, Toulouse, France. IV:2197:2199,

Interpretive Summary:

Technical Abstract: Monitoring crop condition and yields at regional scales using the traditional operational NOAA AVHRR data has been a challenge. The 1 km spatial resolution with two primary spectral bands in the visible and near infrared is inadequate for development of field level canopy parameters. MODIS imagery from the relative new Terra satellite system offers an excellent opportunity for daily coverage and an adequate resolution required in operational crop condition and yield assessments. The objective of this research is to investigate the applicability of the 8-day MODIS composite data in the operational programs for crop condition and yield assessment. A field study was conducted in the predominantly corn and soybean area of central Iowa in the Upper Midwest U.S. This study site was a 100 x 50 km area where a NASA-funded soil moisture study was also conducted. Ground measurements of crop growth, development, leaf area index (LAI) and canopy reflectance, were monitored. Landsat data was used to develop the landuse classification. Canopy parameters were derived from the MODIS 8-day composite daily surface reflectance at 250m resolutions. The Landsat classification was applied the MODIS imagery to separate vegetation classes. LAI derived was from surface reflectance data using a radiative transfer model. LAI derived from MODIS imagery during the crop season were integrated in a crop yield simulation model. LAI, soil moisture and crop yields were simulated at 250 m resolution and results were mapped at 1.6 km2 scale over the study area.