|Goodwin, Stephen - Steve|
Submitted to: Phytopathology
Publication Type: Abstract Only
Publication Acceptance Date: 6/10/2003
Publication Date: 7/31/2003
Citation: Adhikari, T., Wallwork, H., Goodwin, S.B. 2003. Genetic mapping of septoria tritici leaf blotch resistance genes stb2 and stb3 in wheat. Phytopathology. 93(s):2.
Technical Abstract: Septoria tritici leaf blotch (STB), caused by Mycosphaerella graminicola (anamorph: Septoria tritici), occurs in most wheat production areas worldwide. Genes Stb2 and Stb3 have been identified in wheat germplasm and confer resistance to many strains of M. graminicola in Australia and the U. S. Doubled-haploid populations segregating for Stb2 and Stb3 were evaluated in the greenhouse for STB reaction and analyzed with microsatellite markers to identify those linked to the resistance genes. Linkage analysis revealed that marker Xgwm389 was 2.8 cM from Stb2, and that Xgdm132 was linked to Stb3 at a distance of 3.6 cM. Stb2 and Stb3 mapped to the distal region of the short arm of wheat chromosomes 3B and 6D, respectively. These markers could be useful in wheat breeding programs for the selection of lines resistant to STB and for gene pyramiding. Quantification of fungal biomass in resistant and susceptible wheat cultivars by real-time polymerase chain reaction and analysis of genes expressed during the wheat-M. graminicola interaction are in progress.