Author
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Goates, Blair |
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Submitted to: Phytopathology
Publication Type: Proceedings Publication Acceptance Date: 1/1/2004 Publication Date: 5/1/2004 Citation: Goates, B. 2004. Resistance genes and sources of resistance for control of dwarf bunt of wheat (TCK) caused by Tilletia controversa (Kuhn). Phytopathology. 15th International Plant Protection Congress. Beijing, China, May 11-16, 2004. p. 351. Interpretive Summary: Technical Abstract: Dwarf bunt, also called TCK, can occur on winter wheat in isolated portions of the Northwestern US. A high level of resistance has been incorporated into U.S. cultivars which has eliminated yield or quality losses from dwarf bunt in areas where they are grown. Fifteen major resistance genes, Bt1 through Bt15, have been identified that follow the classic gene-for-gene system. The gene Bt8 is primarily responsible for the resistance of most of the cultivars, but some cultivars have Bt12 in combination with other genes. Resistance provided by these genes has remained stable and highly effective for the past 20 to 30 years. The genes Bt5 and Bt11 are also highly effective, but have not yet been utilized. Thousands of bread wheats (Triticum aestivum) from around the world in the USDA National Small Grains Collections have been screened for resistance. Several of these wheats have been immune, or nearly so, in extensive tests under extreme disease pressure using pathogenic race composites, exotic races, and 8 races developed to contain a high number of virulence genes, or specific gene combinations. The tests were conducted using natural and artificial infection procedures. The highly resistant wheats are primarily land races originating from Eastern Turkey and Yugoslavia. These resistant sources represent new genes or gene combinations. Dwarf bunt and common bunt, caused by Tilletia tritici and T. laevis, are regulated by the same resistance genes. Therefore these genes also can be used to control common bunt. |
