|Sudduth, Kenneth - Ken|
Submitted to: Agronomy Abstracts
Publication Type: Abstract Only
Publication Acceptance Date: 10/26/2001
Publication Date: N/A
Technical Abstract: Characterization of soil and landscape properties and how they interact with each other is a critical step in understanding yield variability found in yield maps. Corn and soybean yield, soil (fertility and soil electrical conductivity), and landscape (elevation, slope, aspect) measurements were obtained from two fields from each of 6 Midwest states (Illinois, Iowa, Michigan, Missouri, South Dakota, and Wisconsin). Generally, fertility factors alone were less important in explaining yield variability than were soil electrical conductivity (EC) and elevation. Yield from high EC areas tended to be less stable when high clay content was the primary soil property affecting EC. Analysis is being done to determine which specific sensor-based soil and landscape properties can be used over a wide range of soil and climates to explain within field variation. Also, software has been developed and is being evaluated for using this type of information in nmanagement zone delineation.