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item Colvin, Thomas
item Jaynes, Dan
item Kaspar, Thomas
item James, David
item Meek, David

Submitted to: International Conference on Precision Agriculture Abstracts & Proceedings
Publication Type: Abstract Only
Publication Acceptance Date: 7/19/2000
Publication Date: 7/19/2000
Citation: Colvin, T.S., Jaynes, D.B., Kaspar, T.C., James, D.E., Meek, D.W. 2000. Yield certainty with plots or fields [CD-ROM]. International Conference on Precision Agriculture Abstracts & Proceedings. St. Paul, Minnesota.

Interpretive Summary:

Technical Abstract: Most research with crops and the majority of research with soils use crop yield measurements. We go to great lengths to make specialized measurements of many things that can be quite esoteric and then may not take much thought to the methods and sources of error inherent in yield measurements. This paper is based on experience with yield plots within large fields and with traditional "small" experimental plots. We have used hand harvesting, plot combine measurements, and commercial combines with yield monitors. The sources of error include year-to-year positioning of plots, physical size of the plots or areas, moisture measurements, loss of yield due to shattering or lodging, and mixing grain in the combine between small areas in the field. With many potential sources of error, it is easy to see that small errors may easily combine into a substantial error in final yield determination.