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ARS Home » Research » Publications at this Location » Publication #111203
Title: A QTL FOR DEOXYNIVALENOL TOLERANCE IN WHEAT

Author
item BAI, GUIHUA - OSU, STILLWATER, OK
item Plattner, Ronald
item SHANER, GREGORY - PURDUE, W LAFAYETTE, IN
item KOLB, FREDERIC - UNIV OF IL, CHAMPAIGN, IL

Submitted to: American Phytopathology Society
Publication Type: Abstract Only
Publication Acceptance Date: 8/16/2000
Publication Date: N/A
Citation: N/A

Interpretive Summary:

Technical Abstract: Deoxynivalenol (DON, a mycotoxin) produced by Fusarium graminearum in wheat grain is detrimental to livestock and human health. Significant differences in DON levels of infected grain are observed among wheat cultivars after infection with the fungus. However, genetic control of DON accumulation in wheat is not well characterized. To map quantitative trait loci (QTL) for low DON level in infected wheat grain, an amplified fragment length polymorphism (AFLP) linkage map was constructed using F9 recombinant inbred lines (RILs). The mapping population was derived from a cross between low DON cultivar Ning 7840 (7 ppm) and a high DON cultivar Clark (151 ppm). The plants of F11 RILs were sprayed with conidia of F. graminearum on flowered spikes in the greenhouse. The inoculated spikes were harvested and the kernels were analyzed for DON levels with a fluorometric quantitation method. One QTL for low DON level was identified and explained about 23 and 26% of the phenotypic variance (R2) in two repeated experiments, respectively. Relationships between visual scab symptoms and DON levels will be discussed.