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ARS Home » Plains Area » Manhattan, Kansas » Center for Grain and Animal Health Research » Hard Winter Wheat Genetics Research » Research » Research Project #423363

Research Project: Develop High-Throughput Markers for Genetic Improvement Of Wheat For Multiple Traits

Location: Hard Winter Wheat Genetics Research

Project Number: 3020-21000-010-016-S
Project Type: Non-Assistance Cooperative Agreement

Start Date: Sep 1, 2012
End Date: Aug 30, 2017

Develop and implement next generation molecular marker technology in wheat breeding.

Mapping populations will be analyzed using the 90K wheat SNP chip and SSR markers and detailed SNP/SSR maps will be constructed and used for mapping of important loci controlling disease resistance, abiotic stress tolerance, grain quality, etc. Low-throughput markers reported for different genes will be converted into a set of high throughput SNP markers by LD analysis of 90K SNP chip. Developed SNPs will be assembled into sets of 30-35 SNP markers to be analyzed in Sequenom MassArray and validated using different mapping populations. Those marker sets will be used for selection of multiple traits in breeding programs.