Location: Crop Diseases, Pests and Genetics
Title: Development of Arabidopsis thaliana as a model host for Xylella fastidiosa Author
Submitted to: CDFA Pierce's Disease Control Program Research Symposium
Publication Type: Abstract Only
Publication Acceptance Date: October 15, 2010
Publication Date: December 15, 2010
Citation: Rogers, E.E. 2010. Development of Arabidopsis thaliana as a model host for Xylella fastidiosa. CDFA Pierce's Disease Control Program Research Symposium, San Diego, CA, Dec 15-17, 2010. p.272. Technical Abstract: The bacterium Xylella fastidiosa (Xf) causes Pierce's disease and a number of other plant diseases of significant economic impact. To date, progress determining mechanisms of host plant susceptibility, tolerance or resistance has been slow, due in large part to the long generation time and limited available genetic resources for grape and other known hosts of Xf. To overcome many of these limitations, Arabidopsis thaliana has been evaluated as a host for Xf. A pin-prick inoculation method has been developed to infect Arabidopsis with Xf. Following infection, Xf multiplies robustly and can be detected by microscopy, PCR and culturing. The ecotypes Van-0, LL-0 and Tsu-1 all allow more growth of Xf strain Temecula than the reference ecotype Col-0. Affymetrix ATH1 microarray analysis of inoculated vs. non-inoculated Tsu-1 reveals gene expression changes that differ greatly from changes seen after infection with apoplast colonizing bacteria. Many genes responsive to abiotic stress are differentially regulated while classic pathogenesis-related (PR) genes are not induced by Xf infection.