Author
DIERS, BRIAN - University Of Illinois | |
KIM, KI-SEUNG - University Of Illinois | |
HUDSON, MATTHEW - University Of Illinois | |
HILL, CURT - University Of Illinois | |
Hartman, Glen | |
WANG, JIANPING - University Of Illinois |
Submitted to: Meeting Abstract
Publication Type: Abstract Only Publication Acceptance Date: 8/10/2010 Publication Date: 8/10/2010 Citation: Diers, B., Kim, K., Hudson, M., Hill, C., Hartman, G.L., Wang, J. 2010. Aphid Resistance: From Fine Mapping to Cultivar Development [abstract]. To be submitted to 13th Biennial Molecular and Cellular Biology of the Soybean Conference 2010. Durham, NC, August 8-11, 2010. CD ROM. Interpretive Summary: Technical Abstract: Soybean aphid [Aphis glycines Matsumura (Hemiptera: Aphididae)] was first identified as a soybean [Glycine max (L.) Merr.] pest in North America in 2000. Since that time, infestations have reached economic thresholds annually resulting in widespread spraying of the Midwest soybean crop with insecticides. After the 2000 discovery, screening of the soybean germplasm collection for resistance resulted in the identification of accessions with antibiosis and antixenosis resistance. From these resistant accessions, two genes that confer antibiosis resistance were mapped and named Rag1 and Rag2. TaqMan SNP marker assays have been developed for these two genes and they have been successfully used in marker-assisted selection. Recent fine mapping efforts have resulted in the mapping of Rag1 to a 115 kb interval and Rag2 to a 54 kb interval. The Williams 82 sequence for the interval Rag1 maps contains two predicted nucleotide binding leucine-rich repeat (NBS-LRR) candidate resistance genes and the Rag2 interval contains one predicted NBS-LRR candidate gene. Because Williams 82 carries neither Rag1 nor Rag2, the intervals these genes map need to be cloned and sequenced from genotypes carrying the genes to identify gene candidates from the resistance sources. |