|Huang, Xueling - WASHINGTON STATE UNIV|
|Settles, Matthew - WASHINGTON STATE UNIV|
|Zhan, Gangming - WASHINGTON STATE UNIV|
Submitted to: APS Annual Meeting
Publication Type: Abstract Only
Publication Acceptance Date: April 1, 2008
Publication Date: June 1, 2008
Citation: Coram, T., Huang, X., Settles, M.L., Zhan, G., Chen, X. 2008. Comparative analysis of transcripts associated to all-stage resistance and high-temperature adult-plant resistance to stripe rust in wheat. APS Annual Meeting. Phyto 98:S41. Technical Abstract: Stripe rust, caused by Puccinia striiformis f. sp. tritici, is a destructive disease of wheat worldwide. Genetic resistance is the preferred method for controlling stripe rust, of which two major types are race-specific and race non-specific resistance. Race-specific resistance includes the qualitatively inherited all-stage resistance, controlled by single major resistance (R) genes. Conversely, high-temperature adult-plant (HTAP) resistance is race non-specific, inherited quantitatively, and is durable. Previously, we characterized the gene expression signatures involved in Yr5-controlled all-stage resistance and Yr39-controlled HTAP resistance using the Affymetrix Wheat GeneChip. For this study, we designed and constructed custom oligonucleotide microarrays containing probes for the 116 and 207 transcripts that we had found important for the Yr5 and Yr39 resistance responses, respectively. We used this custom microarray to profile the resistance responses of eight wheat genotypes with all-stage resistance (Yr1, Yr5, Yr7, Yr8, Yr9, Yr10, Yr15, and Yr17) and five genotypes with HTAP resistance (Yr18, Yr29, Yr36, Yr39, and the HTAP resistance gene in the Yr8 line). The aim of this analysis was to identify common and unique gene expression signatures involved in the two types of resistance, which were used to infer information regarding the general pathways involved in all-stage resistance and HTAP resistance.