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United States Department of Agriculture

Agricultural Research Service

Title: Genetic Diversity of a World-Wide Collection of Puccinia Triticina from Durum Wheat Using Simple Sequence Repeat Markers and Rdna Sequence

item Kolmer, James
item Szabo, Les

Submitted to: Phytopathology
Publication Type: Abstract Only
Publication Acceptance Date: June 1, 2005
Publication Date: June 1, 2005
Citation: Ordonez, M.E., Kolmer, J.A., Szabo, L.J. 2005. Genetic diversity of a world-wide collection of Puccinia triticina from durum wheat using simple sequence repeat markers and rDNA sequence [abstract]. Phytopathology. 95:S78.

Technical Abstract: Leaf rust caused by Puccinia triticina is a major disease of wheat causing annual economic losses. Leaf rust on durum wheat has recently become more prevalent in Europe, Mexico, and South America. In order to determine genetic diversity of P. triticina populations on durum wheat, simple sequence repeat (SSR) markers were developed, and sequence data of the rDNA was obtained. Collections of P. triticina included isolates from Argentina, Ethiopia, France, Mexico, Spain, and the U.S.A. The P. triticina SSR markers consist mainly of di-nucleotide (CT, AG, and AC) repeats as well as tri-nucleotide repeats (CAA). Single copy SSR loci had up to six alleles among a small set of leaf rust isolates. Some SSR markers targeted more than one locus in P. triticina, these primers amplified up to nine alleles overall. Further analysis of these codominant markers will be presented. Analysis of sequence data from the nuclear rDNA ITS region showed very little variation and therefore was not useful for separating populations.

Last Modified: 4/18/2015
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