Submitted to: Journal of Theoretical and Applied Genetics
Publication Type: Peer Reviewed Journal
Publication Acceptance Date: November 20, 2005
Publication Date: December 21, 2005
Citation: Marza, F., Bai, G., Carver, B. 2005. Qtls for yield and related traits in the wheat population, ning 7840 x clark. Journal of Theoretical and Applied Genetics. 112:688-698. Interpretive Summary: Grain yield and associated traits are important factors in wheat improvement. Genetic information regarding genes to control yield and its components would facilitate development of high yield cultivars using molecular marker-based selection. A population of recombinant inbred lines (RILs) was derived from a cross between a hard wheat, Ning7840, and a soft wheat, Clark. A total of 15 yield-related traits were evaluated in three locations in Oklahoma from 2001 to 2003. A genetic linkage map with 410 molecular markers was constructed. We identified 10, 16, 30, and 14 genes for yield, yield components, plant adaptation (shattering and lodging resistance, heading date, and plant height), and spike morphology traits, respectively. Results of this study provide a benchmark for future efforts on gene identification for yield traits.