Submitted to: Phytopathology
Publication Type: Abstract Only
Publication Acceptance Date: July 29, 2002
Publication Date: July 29, 2002
Citation: Adhikari, T., Anderson, J.M., Goodwin, S.B. 2002. Molecular mapping of septoria tritici leaf blotch resistance in wheat. Phytopathology. Technical Abstract: Septoria tritici leaf blotch (STB), caused by the ascomycete fungus Mycosphaerella graminicola (anamorph Septoria tritici), is one of the most destructive diseases of wheat worldwide. Host plant resistance is the preferred method of disease control. The identification and mapping of STB resistance genes and the development of resistant wheat cultivars can be facilitated through the use of molecular markers. A total of 126 F10 recombinant inbred lines from a cross between the highly resistant synthetic hexaploid wheat, W7984, and the highly susceptible cultivar, Opata 85, was evaluated for STB reaction and molecular markers. Genetic analysis indicated that a single dominant gene controls the resistance to STB. Bulked segregant analysis based on amplified fragment length polymorphism (AFLP) was used to develop a genetic linkage map. An AFLP marker, EcoRI-ACG/MseI-CAG5, was linked in repulsion with the STB resistance gene at a distance of approximately 5.1 cM. Chromosome 7B is the putative location of this resistance gene based on its association with previously mapped microsatellite markers. Efforts to find additional linked markers are continuing.