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United States Department of Agriculture

Agricultural Research Service

Title: Interactions of Soil and Landscape Properties on Corn-Soybean Yield Variability in the Us Midwest

item Kitchen, Newell
item Wiebold, W - UNIV OF MO
item Bullock, D - UNIV OF IL
item Sudduth, Kenneth
item Clay, D - S DAK STATE UNIV
item Batchelor, W - IA STATE UNIV
item Schuler, R - UNIV OF WI-MADISON

Submitted to: Agronomy Abstracts
Publication Type: Abstract Only
Publication Acceptance Date: October 26, 2001
Publication Date: N/A

Technical Abstract: Characterization of soil and landscape properties and how they interact with each other is a critical step in understanding yield variability found in yield maps. Corn and soybean yield, soil (fertility and soil electrical conductivity), and landscape (elevation, slope, aspect) measurements were obtained from two fields from each of 6 Midwest states (Illinois, Iowa, Michigan, Missouri, South Dakota, and Wisconsin). Generally, fertility factors alone were less important in explaining yield variability than were soil electrical conductivity (EC) and elevation. Yield from high EC areas tended to be less stable when high clay content was the primary soil property affecting EC. Analysis is being done to determine which specific sensor-based soil and landscape properties can be used over a wide range of soil and climates to explain within field variation. Also, software has been developed and is being evaluated for using this type of information in nmanagement zone delineation.

Last Modified: 4/22/2015
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