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United States Department of Agriculture

Agricultural Research Service

Title: Relating Corn and Soybean Yield with Sensor Based and Grid-Sampled Soil Properties

Authors
item Kitchen, Newell
item Sudduth, Kenneth
item Jung, W - UNIV OF MO

Submitted to: Agronomy Abstracts
Publication Type: Abstract Only
Publication Acceptance Date: October 26, 2001
Publication Date: N/A

Technical Abstract: Understanding and quantifying spatial variability of mapped crop yield and field properties are critical for evaluating soil productivity and advancing site-specific field management. This study was carried out to understand the relationships and spatial variability of corn and soybean yield and soil and landscape properties for a claypan soil field in Missouri using geostatistics and principle component analysis (PCA). In April 2000, 282 soil samples were collected at a 25-m grid spacing to a 15- cm depth from a 14-ha claypan soil field. The soil samples were analyzed for texture, total N, pH, O.M., P, Ca, Mg, K, and CEC. Soil profile electrical conductivity and elevation were also obtained at soil sample locations. Soybean (1996, 1998, 1999) and corn (1997, 2000) yield data were measured using a combine equipped with a yield sensing system and GPS receiver. From principle component analysis (PCA), the first four principle components explained 84% of the total variance. These component were mainly affected by cation and acidity properties. Measured corn and soybean yield data were related to soil properties and principle components.

Last Modified: 7/22/2014
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